IEC 61967-4 PDF
IEC +AMD CSV Standard | Integrated circuits – Measurement of electromagnetic emissions, kHz to 1 GHz – Part 4. IEC INTEGRATED CIRCUITS – MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, KHZ TO 1 GHZ – PART 4: MEASUREMENT OF. Buy IEC INTEGRATED CIRCUITS – MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, KHZ TO 1 GHZ – PART 4: MEASUREMENT OF.
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The signal and supply connections to the test IC are established through a plug connector on the test board. Figure 20 Test set-up with the P probe set and ICE1 test environment without a control unit and microscope camera Figure 21 Pin contact visualised with the digital microscope camera 4.
Ie connection cables must be replaced!
Figure 11 P probe 2. The main settings of the spectrum analyser have to be defined in the 6167-4 Analyser Manager” Figure Figure 10Design of the test board; top with Vss bridges, bottom with back-up capacitors, filters and quartz crystal oscillator circuit 2 P probe 2.
Gives advice for performing test methods described in IEC by classifying types of integrated circuits ICs and providing hints for test applications related to the IC type classification.
The impedance of the capacitor C ext should be at least 3 dB smaller than the shunt’s 1 Ohm resistance. Figure 13 shows the equivalent circuit diagram of the P probe. The test IC is supplied via the test board and controlled via the connection board. The input of the matching network is connected to the probe’s pin contact Figure Figure 31 P characteristic. The output of the matching network is connected to the 50 Ohm SMB port at the rear end of the probe. These definitions concern IC related operating modes, pins and ports to be tested, test set-ups according IECincluding description of load circuits and RF path, and IC related emission limits or limit classes.
Figure 25 Loading the 16967-4 curves K to the “Corrections Selector” The correction curve K is loaded to the “Corrections Selector” if the P probe is used for the measurement. Figure 30 P characteristic. The test IC is mounted on the test board.
Langer EMV – S / S set, 1 Ohm / Ohm, Conducted RF Measurement acc. IEC
Learn more about the cookies we use and how to change your settings. A cable is used to connect the probe’s output to a measuring instrument such as a spectrum analyser.
The correction curve K is loaded to the “Corrections Selector” if the P probe is used for the measurement. Langer 619967-4 GmbH will remedy any fault due to defective material or defective manufacture, either by repair or by delivery of replacement, during the statutory warranty period.
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The measurement is performed with a 1 Ohm shunt. The correction can also be made later on if the measurement has been carried out using the P probe without any correction.
Application guidance to IEC This warranty is only granted on condition that: Figure 17 Internal P design Figure 17 shows the equivalent circuit diagram of the P probe. Search all products by.
PD IEC/TR 61967-4-1:2005
A measurement log can be kept in the free text field under “Comment”. Anwendungsleitfaden zu IEC The P current probe head has an inductance L P of 1 nH in 619677-4 line from the tip of the probe contact to the shunt. An IC internal connection to other Vdd supply pins is assumed for a voltage measurement on a Vdd pin Figure 7.
IEC 61967-4 Ed. 1.0 b Cor.1(2017)
Then you can start reading Kindle books on your smartphone, tablet, or computer – no Kindle device required. Figure 3 P, current measurement on a single Vss pin Figure 4 P, current measurement on a single Vdd pin Figure 5 P, voltage measurement on a signal pin while this is in operation Figure 6 P, current measurement on a signal pin while this is in operation The external capacitor C ext can reduce the stress on the signal pin caused by the probe’s low impedance 1 Ohm Figure 6 during current measurements on signal pins.
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